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Lateral bipolar transistor with additional ESD implant

机译:横向双极晶体管,带有额外的ESD注入

摘要

A semiconductor device (10) includes a semiconductor body (12) of a first conductivity type (e.g., p-type). A first doped region (14) of a second conductivity type (e.g., n-type) is disposed at an upper surface of the semiconductor body (12). A second doped region (16) of the second conductivity type is disposed at the upper surface of the semiconductor body (12) and is separated from the first doped region (14) by an isolation region (18). A first contact (26) overlies and is electrically coupled to the first doped region (14) and a second contact (28) overlies and is electrically coupled to the second doped region (16). A third doped region (32) of the first conductivity type is disposed within the semiconductor body (12) beneath the first doped region (14).
机译:半导体器件(10)包括第一导电类型(例如,p型)的半导体本体(12)。第二导电类型(例如,n型)的第一掺杂区(14)设置在半导体本体(12)的上表面处。第二导电类型的第二掺杂区(16)设置在半导体本体(12)的上表面处,并且通过隔离区(18)与第一掺杂区(14)隔开。第一触点(26)位于第一掺杂区(14)上并与其电耦合,第二触点(28)位于第二掺杂区(16)上并与其电耦合。第一导电类型的第三掺杂区(32)在第一掺杂区(14)下方设置在半导体本体(12)内。

著录项

  • 公开/公告号EP1708274A3

    专利类型

  • 公开/公告日2009-06-24

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号EP20060110965

  • 发明设计人 SCHNEIDER JENS;WENDEL MARTIN;

    申请日2006-03-10

  • 分类号H01L29/735;H01L27/02;H01L29/10;

  • 国家 EP

  • 入库时间 2022-08-21 19:18:11

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