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METHOD AND DEVICE FOR IMPROVING STABILITY OF 6T SGT CMOS SRAM CELL

机译:提高6T SGT CMOS SRAM单元稳定性的方法和装置

摘要

A device structure of a 6T SGT CMOS SRAM cell having a sufficiently high SNM and its manufacturing method. An SGT device comprises an access NMOS device using a sidewall surface as a first crystal plane to provide a first carrier mobility, a pulldown NMOS device using a sidewall surface as a second crystal plane to provide a second carrier mobility, and a pullup PMOS device using a sidewall surface as a third crystal plane to provide a third carrier mobility, and at least one of the first, second, and third crystal planes differs from the other two crystal planes. This constitution is formed from SGT transistors having a relatively low gain and a low carrier mobility plane and SGT transistors having a relatively high gain and a high carrier mobility plane. The SGT having the high-mobility plane has a higher gain than the SGT having the low-mobility plane.
机译:具有足够高的SNM的6T SGT CMOS SRAM单元的器件结构及其制造方法。 SGT器件包括使用侧壁表面作为第一晶体平面以提供第一载流子迁移率的访问NMOS器件,使用侧壁表面作为第二晶体平面以提供第二载流子迁移率的下拉NMOS器件以及使用侧壁表面作为第三晶体平面以提供第三载流子迁移率,并且第一,第二和第三晶体平面中的至少一个不同于其他两个晶体平面。该构造由具有相对低增益和低载流子迁移率平面的SGT晶体管以及具有相对高增益和高载流子迁移率平面的SGT晶体管形成。具有高迁移率平面的SGT具有比具有低迁移率平面的SGT更高的增益。

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