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Stability and Performance Analysis of Low Power 6T SRAM Cell and Memristor Based SRAM Cell using 45NM CMOS Technology

机译:使用45NM CMOS技术的低功耗6T SRAM单元和基于忆阻器的SRAM单元的稳定性和性能分析

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In recent years, there has been a growing demand for low-power devices, due to the fact that the expansion of CMOS technology. Scale, the crystal size corresponds to the SOC storage phenomenon, system-on-chip (SOC), decreased by the number of transistors increased. Overall, the number of transistors in the number of transistors on a chip of information is used for various functions. They need economic, low energy consumption to promote the design capacity to increase, low power consumption and little memory because it plays an important role for the growth of the overall energy consumption device design parameters playing tight leakage power devices. Although it can be used any bit of the flip-flop - hitting the SRAM-type semiconductor SRAM: this memory is turned off to the loss of data in the conventional sense. It is used to compare the results of the memristor SRAM and SRAM. The calculation is simple memristor SRAM and SRAM based on the design parameters in 45nm technology, the Cadence tool.
机译:近年来,由于CMOS技术的扩展,对低功率器件的需求不断增长。结垢时,晶体尺寸对应于SOC的存储现象,片上系统(SOC)减少,晶体管数量增加。总的来说,信息芯片上的晶体管数量中的晶体管数量用于各种功能。他们需要经济的低能耗来促进设计能力的提高,低能耗和少存储空间,因为它对于整个耗能器件设计参数的增长起到了至关重要的作用,而漏电器件的设计参数也很严格。尽管可以使用触发器的任何位-击中SRAM型半导体SRAM:按照传统意义,此存储器会因数据丢失而关闭。它用于比较忆阻器SRAM和SRAM的结果。计算是基于45nm技术的Cadence工具的简单忆阻器SRAM和SRAM。

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