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METHOD AND DEVICE FOR IMPROVING THE STABILITY OF 6T SGT CMOS SRAM CELL

机译:提高6T SGT CMOS SRAM单元稳定性的方法和装置

摘要

Provided are a device configuration of a 6T SGT CMOS SRAM cell having a sufficiently high SNM, and a method for manufacturing the device configuration. The SGT device configuration comprises an access NMOS device having a side wall face formed into a first crystal plane so as to acquire a first carrier mobility, a pull-down NMOS device having a side wall face formed into a second crystal plane so as to acquire a second carrier mobility, and a pull-up PMOS device having a side wall face formed into a third crystal plane so as to acquire a third carrier mobility. At least one of the first, second or third crystal planes is different from the remaining two crystal planes. The different crystal plane is formed of an SGT transistor having a plane of a low carrier mobility and a relatively low gain, and an SGT transistor having a plane of a high carrier mobility and a relatively high gain. The SGT having the plane of the high mobility has a higher gain than that of the SGT having the plane of the low mobility.
机译:提供具有足够高的SNM的6T SGT CMOS SRAM单元的器件配置,以及用于制造该器件配置的方法。 SGT器件配置包括具有形成为第一晶面的侧壁面以获取第一载流子迁移率的访问NMOS器件,具有形成为第二晶面的侧壁面以获取第一载流子迁移率的下拉NMOS器件。第二载流子迁移率,以及具有形成为第三晶面的侧壁面以获取第三载流子迁移率的上拉PMOS器件。第一,第二或第三晶面中的至少一个不同于其余两个晶面。该不同的晶面由具有低载流子迁移率和相对低增益的平面的SGT晶体管,以及具有高载流子迁移率和相对高增益的平面的SGT晶体管形成。具有高迁移率平面的SGT具有比具有低迁移率平面的SGT更高的增益。

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