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Design manner of semiconductor integrated circuit and semiconductor integrated circuit, and tip/chip circumference wiring of program null flip chip

机译:半导体集成电路和半导体集成电路的设计方式以及程序空倒装芯片的尖端/芯片圆周布线

摘要

PROBLEM TO BE SOLVED: To lower the upper/lower side inner region and the right/left side inner region of a semiconductor chip in wiring resistance than usual and to make areas located at a symmetrical position in the upper/lower part and the right/left part of the chip equivalent in wiring resistance to each other.;SOLUTION: The sides of the chip extending in a first direction are considered as the upper/lower side of the chip, and the sides of the chip extending in a second direction (e. g. a vertical direction) intersecting the first direction are considered as the right/left side. In a flip chip where the inner VDD pads and GND pads of the chip are symmetrically arranged as viewed from the upper/lower side and the right/left side of the chip, a first layer (uppermost layer) interconnect line and a second layer interconnect line as the inner power supply interconnect lines of the chip are laid symmetrically and equally distant from the upper/lower side and the right/left side of the chip. At this point, the first layer interconnect line is set perpendicular to the second layer interconnect line. The first layer interconnect line and the second layer interconnect line are connected together through Via at intersections.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:要解决的问题:降低半导体芯片的上/下侧内部区域和右侧/左侧内部区域的布线电阻,使其比平时低,并使区域位于上/下部分和右/下的对称位置。解决方案:将芯片在第一方向上延伸的侧面视为芯片的上/下侧,将芯片在第二方向上延伸的侧面(与第一方向相交的位置(例如垂直方向)被视为右侧/左侧。在从芯片的上/下侧和右/左侧看时,芯片的内部VDD焊盘和GND焊盘对称布置的倒装芯片中,第一层(最上层)互连线和第二层互连作为芯片的内部电源互连线的线对称地布置并且与芯片的上/下侧和右/左侧等距。此时,将第一层互连线设置为垂直于第二层互连线。第一层互连线和第二层互连线通过过孔在相交处连接在一起。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4539916B2

    专利类型

  • 公开/公告日2010-09-08

    原文格式PDF

  • 申请/专利号JP20050012141

  • 发明设计人 加藤 利和;

    申请日2005-01-19

  • 分类号H01L21/822;H01L27/04;H01L21/82;

  • 国家 JP

  • 入库时间 2022-08-21 18:58:27

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