首页> 外国专利> Aforementioned it consists of with the process oxidation the silicon thin film which was formed or nitriding with oxygen or nitrogen making use of the process which forms the silicon thin film which consists of

Aforementioned it consists of with the process oxidation the silicon thin film which was formed or nitriding with oxygen or nitrogen making use of the process which forms the silicon thin film which consists of

机译:前述的方法包括利用形成硅薄膜的方法,通过氧化形成的硅薄膜或用氧气或氮气氮化来形成硅薄膜。

摘要

PROBLEM TO BE SOLVED: To easily and inexpensively form a silicon nanocrystal structure terminating in oxygen or nitrogen which can be formed on a silicon substrate employing a process for manufacturing a silicon integral circuit and shows a high luminous efficiency wherein particle size of the silicon nanocrystals can be controlled to an accuracy of 1-2 nm and density per unit area can be increased by surely terminating the surface of the formed structure by oxygen or nitrogen.;SOLUTION: In a process for forming the silicon nanocrystal structure, a nanometer-thick silicon thin film comprising silicon crystallites and amorphous silicon is formed on the substrate by heating the substrate to a predetermined temperature in a plasma-treatment chamber, controlling the atmosphere inside the chamber to achieve a vacuum atmosphere containing at least a hydrogenated silicon gas and a hydrogen gas and applying a high-frequency electric field. Then, the silicon thin film is subjected to plasma oxidation or plasma nitriding treatment by discontinuing the application of the high-frequency electric field, replacing the atmosphere inside the chamber with an oxidizing or nitriding gas atmosphere and resuming the application of the high-frequency electric field.;COPYRIGHT: (C)2004,JPO
机译:解决的问题:为了容易且廉价地形成可终止于氧或氮的硅纳米晶体结构,该结构可利用制造硅集成电路的工艺形成在硅基板上,并显示出高发光效率,其中硅纳米晶体的粒径可通过精确地用氧或氮终止所形成结构的表面,可以将其控制在1-2 nm的精度内,并且可以增加每单位面积的密度。解决方案:在形成硅纳米晶体结构的过程中,纳米级的硅通过在等离子体处理室中将基板加热至预定温度,控制室内的气氛以实现至少包含氢化硅气和氢气的真空气氛,在基板上形成包括硅微晶和非晶硅的薄膜。并施加高频电场。然后,通过中断高频电场的施加,用氧化或氮化气体气氛代替腔室内的气氛并恢复高频电场的施加来对硅薄膜进行等离子体氧化或等离子体氮化处理。版权:(C)2004,日本特许厅

著录项

  • 公开/公告号JP4405715B2

    专利类型

  • 公开/公告日2010-01-27

    原文格式PDF

  • 申请/专利权人 キヤノンアネルバ株式会社;

    申请/专利号JP20020243342

  • 发明设计人 村尾 幸信;沼沢 陽一郎;

    申请日2002-08-23

  • 分类号C01B33/02;H01L33/34;C09K11/02;C09K11/08;C09K11/59;

  • 国家 JP

  • 入库时间 2022-08-21 18:58:06

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