首页> 外国专利> A CAPACITOR-LESS ONE TRANSISTOR SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED DATA RETENTION ABILITIES AND OPERATION CHARACTERISTICS

A CAPACITOR-LESS ONE TRANSISTOR SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED DATA RETENTION ABILITIES AND OPERATION CHARACTERISTICS

机译:具有改进的数据保持能力和工作特性的无电容单晶体管半导体存储器

摘要

PURPOSE: A capacitor-less 1T semiconductor memory device is provided to improve data sensing margin by enhancing data retention and storage performance. CONSTITUTION: A bottom insulation layer(130) is formed on a substrate(110). An active region is formed on the bottom insulation layer and includes a source region(140), a drain region(160), and a floating body(150) between the source region and the drain region. A gate pattern is formed on the floating body. The floating body includes a main floating body and a first upper floating body. The main floating body has the same height as one of the source region and the drain region. The gate pattern includes a gate insulation layer(180) and a gate electrode(170) formed on the first upper floating body.
机译:目的:提供一种无电容器的1T半导体存储器件,以通过增强数据保留和存储性能来提高数据感测裕度。组成:底部绝缘层(130)形成在基板(110)上。有源区形成在底部绝缘层上,并包括源极区(140),漏极区(160)以及在源极区和漏极区之间的浮体(150)。在浮体上形成栅极图案。浮体包括主浮体和第一上浮体。主浮体具有与源极区和漏极区之一相同的高度。栅极图案包括形成在第一上浮体上的栅极绝缘层(180)和栅电极(170)。

著录项

  • 公开/公告号KR20090116088A

    专利类型

  • 公开/公告日2009-11-11

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号KR20080041784

  • 发明设计人 TAK NAM KYUN;SONG KIW HAN;

    申请日2008-05-06

  • 分类号H01L27/108;H01L27/115;

  • 国家 KR

  • 入库时间 2022-08-21 18:34:04

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