首页> 外国专利> METHOD FOR ETCHING A TRENCH IN FABRICATION A VERTICAL MOSFET DEVICE, CAPABLE OF SIMPLIFY THE FABRICATION PROCESS BY ETCHING THE TRENCH

METHOD FOR ETCHING A TRENCH IN FABRICATION A VERTICAL MOSFET DEVICE, CAPABLE OF SIMPLIFY THE FABRICATION PROCESS BY ETCHING THE TRENCH

机译:在制造垂直MOSFET器件中蚀刻沟槽的方法,该方法能够通过蚀刻沟槽简化制造过程

摘要

PURPOSE: A method for etching a trench in fabrication a vertical MOSFET device is provided to simplify the fabrication process without a hard mask by etching a semiconductor substrate exposed by photoelectrochemistry reaction and forming a trench.;CONSTITUTION: A photoresist mask(202) on a semiconductor substrate(200) is patterned so that a trench forming region is exposed on a semiconductor substrate. A mixing solution is applied on the upper part of the semiconductor substrate. A negative electrode(206) is connected to the mixture solution and a positive electrode(204) is connected to the lower part of the semiconductor substrate. Voltage is applied to a resultant product. Ultra violet radiates on the upper part of the semiconductor substrate to which the voltage is applied. The semiconductor substrate of the trench forming region exposed by photoelectrochemistry reaction is etched. The mixture solution is the mixture of hydrogen peroxide(H2O2) and hydrofluoric acid(HF).;COPYRIGHT KIPO 2010
机译:目的:提供一种在制造垂直MOSFET器件中刻蚀沟槽的方法,以通过刻蚀通过光电化学反应暴露的半导体衬底并形成沟槽来简化制造过程,而无需使用硬掩模;组成:在衬底上的光刻胶掩模(202)图案化半导体衬底(200),使得沟槽形成区域暴露在半导体衬底上。将混合溶液施加在半导体衬底的上部上。负极(206)连接到混合溶液,正极(204)连接到半导体衬底的下部。将电压施加到所得产品上。紫外线辐射在施加电压的半导体衬底的上部。蚀刻通过光电化学反应暴露的沟槽形成区域的半导体衬底。混合溶液是过氧化氢(H2O2)和氢氟酸(HF)的混合物。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100019055A

    专利类型

  • 公开/公告日2010-02-18

    原文格式PDF

  • 申请/专利权人 DONGBU HITEK CO. LTD.;

    申请/专利号KR20080077889

  • 发明设计人 SONG JUNG GYUN;

    申请日2008-08-08

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 18:33:20

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