首页> 外国专利> CMP SLURRY COMPOSITION FOR POLISHING A METAL WIRING, CAPABLE OF OBTAINING A PROPER POLISHING SPEED SELECTIVITY RATIO TO THE METAL WIRING AND AN OXIDE FILM, AND A POLISHING METHOD USING THE SAME

CMP SLURRY COMPOSITION FOR POLISHING A METAL WIRING, CAPABLE OF OBTAINING A PROPER POLISHING SPEED SELECTIVITY RATIO TO THE METAL WIRING AND AN OXIDE FILM, AND A POLISHING METHOD USING THE SAME

机译:用于抛光金属线的CMP浆料组合物,能够获得对金属线和氧化物膜的合适的抛光速度选择性比,以及使用相同方法的抛光方法

摘要

PURPOSE: CMP slurry composition for polishing a metal wiring is provided to be used in a process of polishing the metal wiring due to a proper polishing speed selectivity ratio to the metal wiring and an oxide film.;CONSTITUTION: CMP slurry composition for polishing a metal wiring includes ultrapure water, an abrasive, an oxidizer, a metallic complex compound, and a pH adjusting agent. Colloid silica having a first particle diameter of 10-50 nm and ceria having a first diameter of 10-50 nm are used as the abrasive. The colloid silica and ceria are used in an amount of 0.01 - 3 weight% based on the CMP slurry composition. The weight ratio of the colloid silica and the ceria is 1:20 - 20:1, respectively.;COPYRIGHT KIPO 2010
机译:用途:由于对金属布线和氧化膜具有适当的抛光速度选择性比,因此提供了一种用于抛光金属布线的CMP浆料组合物,以用于金属布线的抛光过程中;组成:用于抛光金属的CMP浆料组合物导线包括超纯水,研磨剂,氧化剂,金属络合物和pH调节剂。具有10-50nm的第一粒径的胶体二氧化硅和具有10-50nm的第一直径的二氧化铈用作磨料。基于CMP浆料组合物,胶体二氧化硅和二氧化铈的用量为0.01-3重量%。硅胶和二氧化铈的重量比分别为1:20-20:1。; COPYRIGHT KIPO 2010

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