首页> 外国专利> TAP IC CONTACT TYPE PROBE UNIT FOR THE INSPECTION OF AN LCD, CAPABLE OF CONTROLLING THE TENSION OF A TENSION PLATE

TAP IC CONTACT TYPE PROBE UNIT FOR THE INSPECTION OF AN LCD, CAPABLE OF CONTROLLING THE TENSION OF A TENSION PLATE

机译:用于检查LCD的TAP IC接触式探头单元,能够控制张力板的张力

摘要

PURPOSE: A TAP IC contact type probe unit for the inspection of a LCD is provided to improve the efficiency of LCD property inspection.;CONSTITUTION: An angle plate(200) is fixed and coupled in the bottom surface of a block body. A tension plate(300) is attached to the bottom surface of the angle plate and is projected in the front end of the angle plate. A block body support is attached to the bottom surface of the block body and the angle plate. A TAP IC(500) is attached to the bottom surface of the block body support and the bottom surface of the tension plate.;COPYRIGHT KIPO 2010
机译:目的:提供用于液晶显示器检查的TAP IC接触式探针单元,以提高液晶显示器性能检查的效率。组成:角板(200)固定并连接在块体的底面。张力板(300)附接至角板的底表面,并且在角板的前端突出。块体支撑件附接到块体的底部表面和角板。 TAP IC(500)附着在块体支架的底面和张力板的底面上。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100092369A

    专利类型

  • 公开/公告日2010-08-20

    原文格式PDF

  • 申请/专利权人 LUKEN TECHNOLOGIES;

    申请/专利号KR20100004573

  • 发明设计人 HWANG SEUG IL;

    申请日2010-01-19

  • 分类号G01R1/073;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:04

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