首页> 外国专利> METHOD OF FORMING A PHASE CHANGE MEMORY DEVICE, CAPABLE OF MAINTAIN THE RESISTANCE OF A PHASE CHANGE MEMORY CELL OVER A SEMICONDUCTOR SUBSTRATE CONSTANT

METHOD OF FORMING A PHASE CHANGE MEMORY DEVICE, CAPABLE OF MAINTAIN THE RESISTANCE OF A PHASE CHANGE MEMORY CELL OVER A SEMICONDUCTOR SUBSTRATE CONSTANT

机译:形成相变存储器件的方法,该器件能够保持在半导体衬底常数上的相变存储单元的电阻

摘要

PURPOSE: A method of forming a phase change memory device is provided to supply electrical bit to a phase change device by forming a void in the phase change memory cell.;CONSTITUTION: A first to third source gas(G1-G3) are inserted into a process chamber. The first source gas has a germanium precursor. A second source gas has an antimony precursor. A third source gas has a tellurium precursor. A reaction gas is inserted into a process chamber during the time of inserting the first to the third gas. A purge gas is inserted into the process chamber during the time of inserting the first to the third gas. A phase change material layer is filled into the opening the inter-layer insulating film of the semiconductor substrate.;COPYRIGHT KIPO 2011
机译:目的:提供一种形成相变存储器件的方法,以通过在相变存储单元中形成空隙来向相变器件提供电钻头。组成:将第一至第三源气体(G1-G3)插入其中处理室。第一源气体具有锗前体。第二种源气体具有锑前体。第三原料气具有碲前体。在将第一气体插入到第三气体期间,将反应气体插入处理室。在将第一气体插入第三气体期间,将吹扫气体插入处理室。相变材料层填充到半导体衬底的层间绝缘膜的开口中。; COPYRIGHT KIPO 2011

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