首页> 外国专利> BUMP FORMING METHOD CAPABLE OF IMPROVING THE ADHESION RELIABILITY OF A BUMP AND CAPABLE OF REDUCING MANUFACTURING COSTS

BUMP FORMING METHOD CAPABLE OF IMPROVING THE ADHESION RELIABILITY OF A BUMP AND CAPABLE OF REDUCING MANUFACTURING COSTS

机译:能够提高粘合的附着可靠性并且能够降低制造成本的凸起形成方法

摘要

PURPOSE: A bump forming method is provided to reduce manufacturing costs by forming copper included in a semiconductor chip with a transcription process on the surface of a bump and removing a reflow process.;CONSTITUTION: A seed metal layer(120) is formed on a carrier wafer(150). An uneven structure PR pattern(124) is formed on the seed metal layer. A reserve bump(128) is formed in the main part of the PR pattern. The reserve bump of the carrier wafer is attached to a wafer(152). The bump is formed on the wafer by separating the carrier wafer from the wafer.;COPYRIGHT KIPO 2011
机译:目的:提供一种凸块形成方法,以通过在凸块表面上进行转录工艺并去除回流工艺来形成半导体芯片中包含的铜来降低制造成本的方法;组成:在衬底上形成籽晶金属层(120)载体晶片(150)。在种子金属层上形成凹凸结构PR图案(124)。在PR图案的主要部分中形成储备凸块(128)。载体晶片的储备凸块附着到晶片(152)。通过将载体晶圆与晶圆分离,在晶圆上形成凸点。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100117754A

    专利类型

  • 公开/公告日2010-11-04

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090036378

  • 发明设计人 HAN KWON HAN;

    申请日2009-04-27

  • 分类号H01L21/60;H01L23/48;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:40

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