首页> 外国专利> A method for multi-level - reading out a phase change memory cell as well as the phase change memory

A method for multi-level - reading out a phase change memory cell as well as the phase change memory

机译:一种用于多级的方法-读出相变存储单元以及相变存储器

摘要

According to a method for multi level - reading of a change in phase - memory cell, first a bit line (9) and a pws - cell (2) is selected, and a first bias voltage (vBl, V00) at the selected bit line (9) is applied. A first read current (iRd00), the by the selected bit line (9) in response to said first bias voltage (vBl, V00) flows, with a first reference current (i00) compared. The first reference current (i00) is such that the first read current (iRd00) is smaller than the first reference current (i00), if the selected pws - cell (2) in a reset - state, and otherwise greater. It is then determined whether the selected pws - cell (2) in the reset - state, on the basis of the comparing the first sense current (iRd00) with the first reference current (i00). A second bias voltage (vBl, V01), the greater than the first bias voltage (vBl, V00) on the selected bit line (9) applied, if the selected pws - cell (2) is not in the reset - state.
机译:根据用于多级-读取相变的存储单元的方法,首先选择位线(9)和pws-存储单元(2),并且选择第一偏置电压(v Bl ,在所选位线(9)上应用V 00 )。响应于所述第一偏置电压(v B1 ,V 00 ),由所选位线(9)产生的第一读取电流(i Rd00 )。 Sub>)流过,并比较了第一参考电流(i 00 )。第一参考电流(i 00 )使得第一读取电流(i Rd00 )小于第一参考电流(i 00 ),如果选定的pws-单元格(2)处于reset-状态,则更大。然后,根据比较第一感测电流(i Rd00 )与第一参考电流(i ),确定所选pws-单元(2)处于复位状态。 00 )。第二偏置电压(v B1 ,V 01 ),大于第一偏置电压(v B1 ,V 00 <如果选定的pws-单元格(2)不处于reset-状态,则在选定的位线(9)上应用/ Sub>)。

著录项

  • 公开/公告号DE102009050746A1

    专利类型

  • 公开/公告日2010-07-01

    原文格式PDF

  • 申请/专利权人

    申请/专利号DE20091050746

  • 发明设计人

    申请日2009-10-27

  • 分类号G11C13/00;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:12

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