首页> 外国专利> DYNAMIC LIGHT-SCATTERING MEASURING DEVICE USING LOW-COHERENCE LIGHT SOURCE AND METHOD OF MEASURING LIGHT-SCATTERING INTENSITY

DYNAMIC LIGHT-SCATTERING MEASURING DEVICE USING LOW-COHERENCE LIGHT SOURCE AND METHOD OF MEASURING LIGHT-SCATTERING INTENSITY

机译:低相干光源的动态光散射测量装置及光散射强度的测量方法

摘要

PROBLEM TO BE SOLVED: To achieve dynamic light-scattering measurement for realizing measurement (measurement of a grain size, its aggregate state, or the like) relating to a highly precise grain size in a solution containing high-concentration fine particle containing minute particles, and also to provide a method of measuring dynamic light scattering.;SOLUTION: A dynamic light-scattering measuring device has: a Mach-Zehnder interferometer; and a low-coherence light source. Also provided is a method of measuring light-scattering intensity of particles in a medium measured by light emitted from a low-coherence light source by using the measurement method of dynamic light-scattering by the Mach-Zehnder interferometer.;COPYRIGHT: (C)2011,JPO&INPIT
机译:要解决的问题:为了实现动态光散射测量,以实现在包含高浓度细颗粒的溶液中进行与高精度粒度有关的测量(粒度,其聚集状态等的测量),解决方案:一种动态光散射测量装置具有:马赫曾德尔干涉仪;和低相干光源。还提供了一种通过使用马赫曾德尔干涉仪的动态光散射测量方法来测量由低相干光源发射的光所测量的介质中颗粒的光散射强度的方法。版权所有:(C) 2011,日本特许厅

著录项

  • 公开/公告号JP2011013162A

    专利类型

  • 公开/公告日2011-01-20

    原文格式PDF

  • 申请/专利权人 FUJIFILM CORP;

    申请/专利号JP20090159307

  • 申请日2009-07-03

  • 分类号G01N15/02;G01N21/27;

  • 国家 JP

  • 入库时间 2022-08-21 18:24:20

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