首页> 外国专利> DYNAMIC LIGHT-SCATTERING MEASURING APPARATUS USING LOW-COHERENCE LIGHT SOURCE AND LIGHT-SCATTERING MEASURING METHOD OF USING THE APPARATUS

DYNAMIC LIGHT-SCATTERING MEASURING APPARATUS USING LOW-COHERENCE LIGHT SOURCE AND LIGHT-SCATTERING MEASURING METHOD OF USING THE APPARATUS

机译:低相干光源的动态光散射测量装置及使用该装置的光散射测量方法

摘要

There is provided a dynamic light-scattering measuring apparatus including: a Mach-Zehnder interferometer; and a low-coherence light source. Further, there is provided a method for measuring light-scattering intensity of particles in a medium, including the steps of: providing a Mach-Zehnder interferometer; and measuring light-scattering intensity from light emitted from a low-coherence light source, in accordance with a dynamic light-scattering intensity measuring process.
机译:提供了一种动态光散射测量装置,包括:马赫曾德尔干涉仪;以及和低相干光源。此外,提供了一种用于测量介质中颗粒的光散射强度的方法,包括以下步骤:提供马赫曾德尔干涉仪;根据动态光散射强度测量过程,从低相干光源发出的光中测量光散射强度。

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