Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry

摘要

We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopyn(LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-windown(DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-lightnsource is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and 6.98 u0001m onnthe top and bottom layers, respectively. The DW method decomposes each OCT A-scan into a time–frequencyndistribution with simultaneously high spectral and spatial resolution. The spectral information from localizednregions in the sample is used to determine scatterer structure. The results show that the two scatterernpopulations can be differentiated using LSS and fLCI. © 2010 Optical Society of America