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METHOD OF FORMING CRYSTALLINE SILICON FILM, THIN-FILM TRANSISTOR USING THE SAME, AND DISPLAY DEVICE

机译:形成晶体硅膜的方法,使用该膜的薄膜晶体管和显示装置

摘要

PROBLEM TO BE SOLVED: To provide a method of forming a crystalline silicon film for forming a crystalline silicon film stable in crystallinity by using a laser of a wavelength in a visible light region.;SOLUTION: This method of forming a crystalline silicon film includes: a first process of forming a metal film; a second process of forming an insulation film on the metal film; and a third process of forming a crystalline silicon film formed of polycrystalline Si on the insulation film. In the second process, the insulation film is formed in a film thickness range of 160-190 nm. The third process includes processes of: forming, on the insulation film, an amorphous silicon film formed of a-Si on the insulation film in a film thickness range of 30-45 nm; and forming the crystalline silicon film by irradiating the amorphous silicon film with laser light of a wavelength in a visible light region.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种形成结晶硅膜的方法,该方法用于通过使用可见光区域中的波长的激光来形成结晶度稳定的结晶硅膜;解决方案:该形成结晶硅膜的方法包括:形成金属膜的第一过程;在金属膜上形成绝缘膜的第二步骤;第三步骤是在绝缘膜上形成由多晶硅形成的结晶硅膜。在第二步骤中,以160-190nm的膜厚度范围形成绝缘膜。第三工序包括以下步骤:在绝缘膜上在绝缘膜上形成膜厚为30-45nm的由非晶硅形成的非晶硅膜;以及在绝缘膜上形成非晶硅膜。通过用可见光区域内的波长的激光照射非晶硅膜来形成结晶硅膜。; COPYRIGHT:(C)2011,JPO&INPIT

著录项

  • 公开/公告号JP2011066243A

    专利类型

  • 公开/公告日2011-03-31

    原文格式PDF

  • 申请/专利权人 PANASONIC CORP;

    申请/专利号JP20090216233

  • 发明设计人 SEGAWA YASUO;

    申请日2009-09-17

  • 分类号H01L21/336;H01L29/786;H01L21/20;H01L21/28;G02F1/1368;

  • 国家 JP

  • 入库时间 2022-08-21 18:21:45

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