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On the suffering etching backing material

机译:上苦蚀底材

摘要

PROBLEM TO BE SOLVED: To provide a dry etching method for etching an etched substrate directly without forming an etching mask of resist, or the like, on the etched substrate in which the etching mask is not required to be exfoliated after dry etching, and to provide an etching mask.;SOLUTION: The etching mask has such a structure as a supporting substrate 32 for holding a thin film substrate through an etching stop layer 33 used for forming an etching mask is provided on a thin film 31 having an etching pattern 45 and an alignment pattern 46 of a penetration mouth formed thereon, and a structure 39 for matching the distance to an etched substrate is provided on the side opposite to the supporting substrate, the supporting substrate and the patterning thin film are covered with a thin film layer 44 for preventing etching and enhancing etch selectivity, and then they are irradiated with etching plasma and when the etched substrate is etched, an etching protection layer 48 for preventing etching is formed through the alignment pattern of the penetration mouth near the penetration mouth of alignment on the supporting substrate side.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:提供一种干蚀刻方法,该干蚀刻方法用于直接蚀刻被蚀刻的基板而不在被蚀刻的基板上形成抗蚀剂等的蚀刻掩模,在该蚀刻基板上干蚀刻后不需要剥离该蚀刻掩模。解决方案:该蚀刻掩模具有这样的结构:在具有蚀刻图案45的薄膜31上设置用于通过用于形成蚀刻掩模的蚀刻停止层33保持薄膜基板的支撑基板32。在其上形成有贯通口的对准图案46,在与支撑基板相反的一侧设置用于使距离与蚀刻后的基板相匹配的结构39,该支撑基板和图案形成薄膜被薄膜层覆盖。为了防止腐蚀并增强腐蚀选择性,使用图44所示的腐蚀保护层48,然后用腐蚀等离子体照射辐射防护层。通过在支撑基板侧上的对准的穿透口附近的穿透口的对准图案形成蚀刻。;版权所有:(C)2007,JPO&INPIT

著录项

  • 公开/公告号JP4654811B2

    专利类型

  • 公开/公告日2011-03-23

    原文格式PDF

  • 申请/专利权人 凸版印刷株式会社;

    申请/专利号JP20050212363

  • 发明设计人 杉村 浩;

    申请日2005-07-22

  • 分类号H01L21/3065;

  • 国家 JP

  • 入库时间 2022-08-21 18:18:51

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