首页> 外国专利> Methods Of Plasma Etching Platinum-Comprising Materials, Methods Of Processing Semiconductor Substrates In The Fabrication Of Integrated Circuitry, And Methods Of Forming A Plurality Of Memory Cells

Methods Of Plasma Etching Platinum-Comprising Materials, Methods Of Processing Semiconductor Substrates In The Fabrication Of Integrated Circuitry, And Methods Of Forming A Plurality Of Memory Cells

机译:等离子刻蚀含铂材料的方法,在集成电路制造中加工半导体衬底的方法以及形成多个存储单元的方法

摘要

A platinum-comprising material is plasma etched by being exposed to a plasma etching chemistry that includes CHCl3, CO2 and O2. In one embodiment, a method of processing a semiconductor substrate in the fabrication of integrated circuitry includes forming metallic platinum-comprising nanoparticles over a material. A portion of the nanoparticles is masked and another portion of the nanoparticles is unmasked. The unmasked portion of the metallic platinum-comprising nanoparticles is plasma etched using a plasma etching chemistry comprising CHCl3, CO2 and O2. Other embodiments are disclosed.
机译:通过暴露于包括CHCl 3 ,CO 2 和O 2 的等离子体蚀刻化学物质中,对含铂材料进行等离子体蚀刻。在一个实施例中,一种在集成电路的制造中处理半导体衬底的方法包括在材料上方形成包含金属铂的纳米颗粒。一部分纳米颗粒被掩盖,而另一部分纳米颗粒未被掩盖。使用包括CHCl 3 ,CO 2 和O 2 的等离子体蚀刻化学方法对包含金属铂的纳米粒子的未掩盖部分进行等离子体蚀刻。公开了其他实施例。

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