首页> 外国专利> OPERATION METHOD OF A NONVOLATILE MEMORY DEVICE, CAPABLE OF CONTROLLING THE WRITE TAIL OF A THRESHOLD VOLTAGE DISTRIBUTION AND THE LEFT TAIL OF A RETENTION BAKE

OPERATION METHOD OF A NONVOLATILE MEMORY DEVICE, CAPABLE OF CONTROLLING THE WRITE TAIL OF A THRESHOLD VOLTAGE DISTRIBUTION AND THE LEFT TAIL OF A RETENTION BAKE

机译:一种非易失性存储器的操作方法,能够控制阈值电压分布的写尾和保留烘烤的左尾

摘要

PURPOSE: An operation method is provided to improve a retention property by applying a pass voltage applied to a non-selected word line after increasing the voltage during a program verification operation.;CONSTITUTION: A plurality of word lines and bit lines cross each other in a memory cell array. A verification voltage is applied to a selected word line(Selected WLn) during a program verification operation. A pass voltage is applied to a non-selected word line(Pass WL). A bit line is pre-charged before a test voltage is applied. A power supply voltage is applied to a drain selected line(DSL).;COPYRIGHT KIPO 2011
机译:目的:提供一种操作方法,通过在编程验证操作期间增加电压后,通过向未选择的字线施加通过电压来提高保持性能。组成:多条字线和位线彼此交叉存储单元阵列。在编程验证操作期间,将验证电压施加到选择的字线(选择的WLn)。将通过电压施加到未选择的字线(通过WL)。在施加测试电压之前,对位线进行预充电。电源电压施加到漏极选择线(DSL)。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100138545A

    专利类型

  • 公开/公告日2010-12-31

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090057129

  • 发明设计人 NOH KEUM HWAN;

    申请日2009-06-25

  • 分类号G11C16/34;G11C16/30;

  • 国家 KR

  • 入库时间 2022-08-21 17:53:02

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