首页> 外国专利> WAFER POLISHING APPARATUS WHICH IS ARRANGING A WAFER WITH IMPROVED PLANARITY AND A WAFER POLISHING METHOD THEREOF

WAFER POLISHING APPARATUS WHICH IS ARRANGING A WAFER WITH IMPROVED PLANARITY AND A WAFER POLISHING METHOD THEREOF

机译:晶圆抛光装置,其中晶圆的平面度得到改善,并且其晶圆抛光方法得到改善

摘要

PURPOSE: A wafer polishing apparatus and a wafer polishing method thereof are provided to reduce pressure applied to an outer circumference part of a wafer by a second pad using a step difference compensation part, thereby uniformly applying the overall pressure from the second pad on the wafer.;CONSTITUTION: A carrier(300) is arranged on a first pad(120) and includes a wafer accepting groove(310) which is accepting a wafer. A step difference compensation part(400) is projected from the upper surface of the carrier and arranged around the wafer. A second pad(220) is arranged on the carrier and step difference compensation part. A wafer polishing apparatus includes the first pad, the carrier, the step difference compensation part, and the second pad.;COPYRIGHT KIPO 2012
机译:用途:提供一种晶片抛光设备及其晶片抛光方法,以减小利用台阶差补偿部分通过第二垫施加到晶片的外周部分上的压力,从而将来自第二垫的总压力均匀地施加到晶片上组成:载体(300)布置在第一垫(120)上,并包括用于容纳晶片的晶片容纳槽(310)。阶梯差补偿部(400)从载体的上表面突出并布置在晶片周围。第二垫(220)布置在载体和台阶差补偿部分上。一种晶片抛光设备,包括第一垫,载体,台阶补偿部分和第二垫。; COPYRIGHT KIPO 2012

著录项

  • 公开/公告号KR20110101360A

    专利类型

  • 公开/公告日2011-09-16

    原文格式PDF

  • 申请/专利权人 LG SILTRON INCORPORATED;

    申请/专利号KR20100020319

  • 发明设计人 PARK WOO SHIK;

    申请日2010-03-08

  • 分类号H01L21/304;

  • 国家 KR

  • 入库时间 2022-08-21 17:51:06

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