Prefixed to the oscilloscope for RESEARCH current-voltage characteristics of Semiconductor Devices

摘要

The invention relates to the field of experimental techniques, namely the characteristics of imaging techniques and is intended for use primarily in the educational process for demonstrations, laboratory work. The technical result is to allow the work-top box in conjunction with the universal oscilloscope while reducing the time for research current-voltage characteristics of semiconductor devices. Technical result is achieved by using the claimed apparatus structural components to provide for efficient switching type studied of semiconductor devices used in the design and application of the inverting amplifier is unleashed on diet with the main part of the circuit operating with respect to their common wire which is connected to the common point the current sensor and the test device, and hence the common wire oscilloscope. Thus it becomes possible to apply to the vertical deflection input of the oscilloscope inverted relative to its total wire tension. The problem is solved in that the attachment to the oscilloscope for the study of the current-voltage characteristics of semiconductor devices comprises a generator linearly varying voltage coupled to the amplifier adapted to bias regulation linearly varying voltage relative to the zero level, and having an output circuit consisting of series connected ballast one of the semiconductor devices and the test current sensor is connected to the inverting amplifier output which is connected to a connector used for connecting to the input of the vertical deflection of the oscilloscope; a second connector for connection to the input of the oscilloscope horizontal deflection coupled with a test semiconductor device through potentiometric voltage divider; a third connector for connecting an additional external investigated semiconductor device and power supply unit consisting of two independent bipolar voltage sources. The prefix allows you to work with a common universal oscilloscope has the ability to lean bias adjustment with respect to the zero level and, in addition, the console contains the main types of semiconductor devices, allowing them to show the CVC without additional preparation. 3 zp p-ly. 11 Fig.