DEVICE FOR MEASURING current-voltage and capacitance-voltage characteristics of semiconductor devices

摘要

The invention relates to measuring equipment, namely, the measurement region and the control of the electrophysical parameters of semiconductor devices by measuring its current-voltage and current-voltage characteristics and can be used to measure the current-voltage and current-voltage characteristics of any two-terminal. A technical effect of the claimed utility model is to expand the functional capabilities, to improve the accuracy of measurement parameters investigated semiconductor device, in the extension of the dynamic characteristics of the measurement range, in enhancing noise immunity, as well as to simplify the structure of the device and expanding the range of devices of this purpose due to the simultaneous and independent measurement the current-voltage and current-voltage characteristics of a semiconductor device. CLAIMS 1 comprises independent claim 3 and dependent claims.