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Method of manufacturing semiconductor device and apparatus for processing substrate

机译:制造半导体器件的方法和用于处理衬底的设备

摘要

A process for producing a semiconductor device, in which in the formation of a boron doped silicon film from, for example, monosilane and boron trichloride by vacuum CVD technique, there can be produced a film excelling in inter-batch homogeneity with respect to the growth rate and concentration of a dopant element, such as boron. The process includes the step of performing the first purge through conducting at least once of while a substrate after treatment is housed in a reaction furnace, vacuuming of the reaction furnace and inert gas supply thereto and the steps of performing the second purge through conducting at least once of after carrying of the substrate after treatment out of the reaction furnace, prior to carrying of a substrate to be next treated into the reaction furnace and while at least no product substrate is housed in the reaction furnace, vacuuming of the reaction furnace and inert gas supply thereto.
机译:制造半导体器件的方法,其中在通过真空CVD技术由例如甲硅烷和三氯化硼形成掺杂硼的硅膜的过程中,可以生产出相对于生长而言具有批间均匀性的膜。掺杂元素(例如硼)的速率和浓度。该方法包括以下步骤:在将处理后的基板容纳在反应炉中的同时进行至少一次第一吹扫;对反应炉进行真空处理并向其供给惰性气体;以及至少通过进行第二次吹扫的步骤。将处理后的基板从反应炉中搬出之后,将要进行下一处理的基板搬入反应炉中之前,并且在反应炉中至少不容纳任何产品基板的情况下,对反应炉进行抽真空和惰性处理供气。

著录项

  • 公开/公告号US8227030B2

    专利类型

  • 公开/公告日2012-07-24

    原文格式PDF

  • 申请/专利权人 KENICHI SUZAKI;TAKAAKI NODA;

    申请/专利号US20090382276

  • 发明设计人 KENICHI SUZAKI;TAKAAKI NODA;

    申请日2009-03-12

  • 分类号C23C16/00;C23C16/22;

  • 国家 US

  • 入库时间 2022-08-21 17:29:34

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