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Silicon carbide power devices with self-aligned source and well regions and methods of fabricating same

机译:具有自对准源和阱区的碳化硅功率器件及其制造方法

摘要

Silicon carbide semiconductor devices and methods of fabricating silicon carbide semiconductor devices are provided by successively etching a mask layer to provide windows for formation of a source region of a first conductivity type, a buried silicon carbide region of a second conductivity type opposite to the first conductivity type and a second conductivity type well region in a first conductivity type silicon carbide layer. The source region and the buried silicon carbide region are formed utilizing a first window of the mask layer. Then, the well region is formed utilizing a second window of the mask layer, the second window being provided by a subsequent etch of the mask layer having the first window.
机译:通过依次蚀刻掩模层来提供碳化硅半导体器件和制造碳化硅半导体器件的方法,以提供用于形成第一导电类型的源极区域,与第一导电性相反的第二导电类型的掩埋碳化硅区域的窗口。第一导电类型碳化硅层中的第二导电类型阱区和第二导电类型阱区。利用掩模层的第一窗口形成源极区和掩埋碳化硅区。然后,利用掩模层的第二窗口形成阱区域,通过随后蚀刻具有第一窗口的掩模层来提供第二窗口。

著录项

  • 公开/公告号EP2463894A1

    专利类型

  • 公开/公告日2012-06-13

    原文格式PDF

  • 申请/专利权人 CREE INC.;

    申请/专利号EP20110183302

  • 发明设计人 RYU SEI-HYUNG;

    申请日2004-02-19

  • 分类号H01L21/336;H01L29/78;

  • 国家 EP

  • 入库时间 2022-08-21 17:12:26

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