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METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE CAPABLE OF IMPROVING A PROPERTY OF A BURIED GATE

机译:制造能够改善潜入门性能的半导体器件的方法

摘要

PURPOSE: A method for manufacturing a semiconductor device is provided to secure the same channel or source/drain distance between cells by forming a junction with the diffusion of dopant included in a PSG layer.;CONSTITUTION: A device isolation area defining an active area is formed on a semiconductor substrate. A recess(180) is formed by etching the semiconductor substrate. A gate electrode pattern(190) is formed in he recess. A PSG(Phosphosilicate Glass) layer(200). An impurity included in the PSG layer is diffused to the active area by thermally processing the PSG layer.;COPYRIGHT KIPO 2012
机译:目的:提供一种制造半导体器件的方法,以通过与PSG层中包含的掺杂剂扩散形成结来确保单元之间的相同沟道或源极/漏极距离。组成:定义有源区的器件隔离区为形成在半导体衬底上。通过蚀刻半导体衬底形成凹槽(180)。在凹部中形成栅电极图案(190)。 PSG(磷硅玻璃)层(200)。通过对PSG层进行热处理,将PSG层中包含的杂质扩散到有源区。COPYRIGHTKIPO 2012

著录项

  • 公开/公告号KR20120030872A

    专利类型

  • 公开/公告日2012-03-29

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20100092689

  • 发明设计人 LEE HYUN JIN;KIM JI HYE;

    申请日2010-09-20

  • 分类号H01L21/336;H01L29/78;

  • 国家 KR

  • 入库时间 2022-08-21 17:10:21

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