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METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE EQUIPPED WITH A BURIED GATE CAPABLE OF IMPROVING A REFRESH PROPERTY BY REDUCING THE CAPACITANCE OF ENTIRE CELLS
METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE EQUIPPED WITH A BURIED GATE CAPABLE OF IMPROVING A REFRESH PROPERTY BY REDUCING THE CAPACITANCE OF ENTIRE CELLS
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机译:制造具有通过降低整个单元格的容量来提高刷新性能的潜入式门的半导体设备的方法
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摘要
PURPOSE: A method for manufacturing a semiconductor device equipped with a buried gate is provided to prevent defects due to the stepped part between a cell region and a core/peripheral region by previously forming a gate conductive film in the peripheral region before a bit-line contact is formed in the cell region.;CONSTITUTION: An element isolation film(13) defining a cell region and a peripheral region is formed on the upper side of a substrate(11). A buried gate(18) is formed in the cell region. A sealing film(19) sealing the upper side of the buried gate is formed. A gate oxide film(20) and a gate conductive film(21) are successively formed on the upper side of the cell region and the peripheral region. A photosensitive pattern(22) is formed to open the cell region using a cell region opening mask.;COPYRIGHT KIPO 2011
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