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RESIST COMPOSITION AND A METHOD FOR MANUFACTURING RESIST PATTERNS USING THE SAME CAPABLE OF IMPROVING THE CRITICAL DIMENSION UNIFORMITY OF RESIST PATTERNS

机译:利用相同的能力来改善抗蚀剂图案的临界尺寸均匀性的抗蚀剂组合物和制造抗蚀剂图案的方法

摘要

PURPOSE: A resist composition and a method for manufacturing resist patterns using the same are provided to prevent the generation of defects on resist patterns.;CONSTITUTION: A resist composition includes a structural unit represented by chemical formula aa, a resin represented by chemical formula ab, and an acid generator. In chemical formula aa, Raa1 is a hydrogen element or a methyl group; Aaa1 is a substitutable C1 to C6 alkandiyl group or a group represented by chemical formula a-1; and Raa2 is substitutable C1 to C18 aliphatic hydrocarbon group, and one or more CH_2 moieties are capable of being substituted with O moieties or CO moieties. In chemical formula a-1, s is 0 or 1; X10 and X11 are respectively oxygen elements, carbonyl groups, carbonyl oxy groups, or oxycarbonyl groups; A10, A11, and A12 are respectively substitutable C1 to C5 aliphatic hydrocarbon groups; and * represents the bond to -O-C(O)-Raa2 moiety.;COPYRIGHT KIPO 2012
机译:目的:提供一种抗蚀剂组合物和使用该抗蚀剂组合物制造抗蚀剂图案的方法,以防止在抗蚀剂图案上产生缺陷。;组成:抗蚀剂组合物包括由化学式aa表示的结构单元,由化学式ab表示的树脂,以及产酸剂。在化学式aa中,R aa1为氢元素或甲基。 Aaa1是可取代的C1至C6烷二基或化学式a-1表示的基团; Raa2为可取代的C1〜C18脂肪族烃基,一个或多个CH_2部分可被O部分或CO部分取代。在化学式a-1中,s为0或1; X10和X11分别是氧元素,羰基,羰基氧基或氧羰基; A10,A11和A12分别是可取代的C1至C5脂族烃基; *表示与-O-C(O)-Raa2部分的键。; COPYRIGHT KIPO 2012

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