首页> 外国专利> OXIDE INCLUDING FILM, AND OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR, AND FABRICATION METHOD OF OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR USING THE SAME

OXIDE INCLUDING FILM, AND OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR, AND FABRICATION METHOD OF OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR USING THE SAME

机译:含氧化物的氧化物,氧化物半导体薄膜晶体管及使用该方法的氧化物半导体薄膜晶体管的制造方法

摘要

PURPOSE: An oxide insulation film, an oxide semiconductor thin film transistor, and a manufacturing method thereof are provided to have high specific resistance by adding a carbon atom to an oxygen atom. CONSTITUTION: A carbon atom is additionally added to an oxygen atom. The carbon atom is added with 1-5% of a gas flow rate in sputtering. An oxide semiconductor material contains the oxygen atom of an appropriate amount. The oxide semiconductor material is used as a channel semiconductor layer. An oxide insulation layer material contains the carbon atom of the appropriate amount added to the oxygen atom.
机译:用途:氧化物绝缘膜,氧化物半导体薄膜晶体管及其制造方法被提供为通过将碳原子添加至氧原子而具有高电阻率。组成:一个碳原子被另外添加到一个氧原子上。在溅射中以1-5%的气体流量添加碳原子。氧化物半导体材料包含适当量的氧原子。氧化物半导体材料用作沟道半导体层。氧化物绝缘层材料包含添加到氧原子中的适当量的碳原子。

著录项

  • 公开/公告号KR20120064626A

    专利类型

  • 公开/公告日2012-06-19

    原文格式PDF

  • 申请/专利权人 LG DISPLAY CO. LTD.;

    申请/专利号KR20110130041

  • 发明设计人 YUN KWI YOUNG;OANA YASUHISA;

    申请日2011-12-07

  • 分类号H01L29/786;

  • 国家 KR

  • 入库时间 2022-08-21 17:09:49

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