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Bipolar junction transistor of poly-emitter type, Bipolar CMOS DMOS device, manufacturing method of bipolar junction transistor of poly-emitter type and manufacturing method of Bipolar CMOS DMOS device

机译:多发射极型双极结型晶体管,双极CMOS DMOS器件,多极型双极结型晶体管的制造方法和双极CMOS DMOS器件的制造方法

摘要

A poly-emitter type bipolar transistor includes a buried layer formed over an upper portion of a semiconductor substrate, an epitaxial layer formed on the semiconductor substrate, a collector area formed on the epitaxial layer and connected to the buried layer, a base area formed at a part of an upper portion of the epitaxial layer, and a poly-emitter area formed on a surface of the semiconductor substrate in the base area and including a polysilicon material. A BCD device includes a poly-emitter type bipolar transistor having a poly-emitter area including a polysilicon material and at least one of a CMOS and a DMOS formed on a single wafer together with the poly-emitter type bipolar transistor.
机译:多发射极型双极晶体管包括:形成在半导体衬底的上部上方的掩埋层;形成在半导体衬底上的外延层;形成在外延层上并连接到该掩埋层的集电极区域;以及外延层的上部的一部分,以及在基极区域中的半导体衬底的表面上形成的包括多晶硅材料的多晶硅发射极区域。 BCD装置包括具有多发射极区域的多发射极型双极晶体管,该多发射极区域包括多晶硅材料以及与多发射极型双极晶体管一起形成在单个晶片上的CMOS和DMOS中的至少一个。

著录项

  • 公开/公告号KR101126933B1

    专利类型

  • 公开/公告日2012-03-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080086324

  • 发明设计人 전본근;

    申请日2008-09-02

  • 分类号H01L29/72;H01L21/328;

  • 国家 KR

  • 入库时间 2022-08-21 17:08:23

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