首页> 外文OA文献 >Fabrication And Electrical Characterization Of Silicon Bipolar Transistors In A O.5µm Based BiCMOS Technology.ud
【2h】

Fabrication And Electrical Characterization Of Silicon Bipolar Transistors In A O.5µm Based BiCMOS Technology.ud

机译:基于O.5µm的BiCMOS技术中硅双极晶体管的制造和电特性。 ud

摘要

Bipolar transistors are well known for its high current driving capability and current gains, while CMOS transistors are dominant in the integrated circuit market because of its low power consumption and small size advantage. The combination of both types of transistor on the same chip provides a high performance circuit with a high packing density. In this work 0.5-µm BiCMOSudtechnology is fully utilized to realize silicon bipolar transistors with optimized performance. Preliminary electrical results are presented on bipolar transistors fabricated for the first time in Malaysia. Significant improvements in electrical device performance can be achieved by optimizing the emitter drive-in temperature and choice of annealing system.
机译:双极晶体管以其高电流驱动能力和电流增益而闻名,而CMOS晶体管因其低功耗和小尺寸优势而在集成电路市场中占主导地位。两种类型的晶体管在同一芯片上的组合可提供具有高封装密度的高性能电路。在这项工作中,充分利用了0.5μm的BiCMOS ud技术来实现具有最佳性能的硅双极晶体管。在马来西亚首次制造的双极晶体管上提供了初步的电气结果。通过优化发射极引入温度和选择退火系统,可以实现电气设备性能的显着改善。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号