首页> 外国专利> Group III nitride semiconductor production method of the self-supporting substrate, III-nitride semiconductor free-standing substrate, III-nitride semiconductor device manufacturing method, and a group III nitride semiconductor device

Group III nitride semiconductor production method of the self-supporting substrate, III-nitride semiconductor free-standing substrate, III-nitride semiconductor device manufacturing method, and a group III nitride semiconductor device

机译:自支撑衬底的III族氮化物半导体制造方法,III族氮化物半导体自立衬底,III族氮化物半导体器件制造方法和III族氮化物半导体器件

摘要

PROBLEM TO BE SOLVED: To provide a method for manufacturing a group III nitride semiconductor free-standing substrate, in which an area of a single crystal plane on the surface of the group III nitride semiconductor free-standing substrate can be enlarged with good reproducibility without performing spherical polishing etc.;SOLUTION: The group III nitride semiconductor free-standing substrate 50 includes an as-grown surface. A region being a half or more of the substrate 50 surface comprises the single crystal plane. The single crystal plane has an off-angle inclined to an m-axis or a-axis direction from a C-plane with group III polarity or to a c-axis or a-axis direction from an M-plane.;COPYRIGHT: (C)2011,JPO&INPIT
机译:解决的问题:提供一种用于制造III族氮化物半导体自支撑衬底的方法,其中可以以良好的再现性扩大III族氮化物半导体自支撑衬底的表面上的单晶面的面积,而无需解决方案:III族氮化物半导体自立衬底50包括生长的表面。基板50的表面的一半以上的区域包含单晶面。单晶平面具有从具有III组极性的C平面向m轴或a轴方向倾斜或从M平面向c轴或a轴方向倾斜的偏角。 C)2011,日本特许厅

著录项

  • 公开/公告号JP5212283B2

    专利类型

  • 公开/公告日2013-06-19

    原文格式PDF

  • 申请/专利权人 日立電線株式会社;

    申请/专利号JP20090161375

  • 发明设计人 江利 健;藤倉 序章;

    申请日2009-07-08

  • 分类号C30B29/38;C30B25/18;H01L21/205;

  • 国家 JP

  • 入库时间 2022-08-21 16:59:32

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号