首页> 外国专利> Vapor deposition method of vapor-phase growth apparatus and the silicon epitaxial layer

Vapor deposition method of vapor-phase growth apparatus and the silicon epitaxial layer

机译:气相生长装置的气相沉积方法和硅外延层

摘要

PROBLEM TO BE SOLVED: To provide a vapor phase growth apparatus and a vapor phase growth method, for thin films such that a thin film continuously varying in impurity concentration along the thickness and a thin film greatly varying in impurity concentration along the thickness are easily formed by vapor phase growth.;SOLUTION: A resistivity distribution of a thin film along the thickness is controlled by introducing a material gas, obtained by a dilute impurity gas obtained by mixing at least an impurity gas and a dilute gas after controlling flow rates thereof by a first flow rate adjusting mechanism 12 and a second flow rate adjusting mechanism 14 respectively with a main gas having its flow rate controlled by a third flow rate adjusting mechanism 16 and then by a fourth flow rate adjusting mechanism 18, into a reaction chamber 22, and carrying out vapor phase growth while supplying the material gas to the reaction chamber 22 while continuously varying the flow rates of the gases flowing through the first, second, and third flow rate adjusting mechanisms simultaneously and continuously under arithmetic control so that the thin film has a desired resistivity profile along the thickness.;COPYRIGHT: (C)2010,JPO&INPIT
机译:解决的问题:提供一种气相生长装置和气相生长方法,用于薄膜,使得容易形成沿着厚度连续变化的杂质浓度的薄膜和沿着厚度连续变化的杂质浓度的薄膜。解决方案:溶液的厚度沿薄膜的电阻率分布是通过引入原料气体来控制的,该原料气体是通过将稀有杂质气体与稀薄气体混合而获得的,该稀薄杂质气体是在通过控制流量后至少混合杂质气体和稀薄气体而获得的。第一流量调节机构12和第二流量调节机构14分别将具有由第三流量调节机构16然后由第四流量调节机构18控制的流量的主气体送入反应室22,在不断地改变气体流量的同时向反应室22供应原料气体的同时进行气相生长。通过第一,第二和第三流量调节机构同时并连续地在算术控制下进行操作,从而使薄膜沿厚度方向具有所需的电阻率分布。版权所有:(C)2010,JPO&INPIT

著录项

  • 公开/公告号JP5251243B2

    专利类型

  • 公开/公告日2013-07-31

    原文格式PDF

  • 申请/专利权人 信越半導体株式会社;

    申请/专利号JP20080125106

  • 发明设计人 山田 透;

    申请日2008-05-12

  • 分类号H01L21/205;C23C16/52;

  • 国家 JP

  • 入库时间 2022-08-21 16:56:14

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号