首页> 外国专利> Method of rapid thermal treatment using high energy electromagnetic radiation of a semiconductor substrate for formation of epitaxial materials

Method of rapid thermal treatment using high energy electromagnetic radiation of a semiconductor substrate for formation of epitaxial materials

机译:使用半导体衬底的高能电磁辐射进行快速热处理以形成外延材料的方法

摘要

A method for fabricating semiconductor devices includes providing a semiconductor substrate having a surface region containing one or more contaminants and having an overlying oxide layer. In an embodiment, the one or more contaminants are at least a carbon species. The method includes processing the surface region using at least a wet processing process to selectively remove the overlying oxide layer and expose the surface region including the one or more contaminants. The method includes subjecting the surface region to a high energy electromagnetic radiation having wavelengths ranging from about 300 to about 800 nanometers for a time period of less than 1 second to increase a temperature of the surface region to greater than 1000 degrees Celsius to remove the one or more contaminants. The method includes removing the high energy electromagnetic radiation to cause a reduction in temperature to about 300 to about 600 degrees Celsius in a time period of less than 1 second.
机译:一种用于制造半导体器件的方法,包括提供具有表面区域的半导体衬底,该表面区域包含一种或多种污染物并且具有上覆的氧化物层。在一个实施例中,一种或多种污染物是至少一种碳。该方法包括使用至少湿法处理工艺来处理表面区域,以选择性地去除上面的氧化物层并暴露包括一种或多种污染物的表面区域。该方法包括使表面区域经受波长在约300至约800纳米范围内的高能电磁辐射,持续时间少于1秒,以将表面区域的温度提高到大于1000摄氏度,以去除表面温度。或更多污染物。该方法包括在不到1秒的时间内去除高能电磁辐射,以使温度降低到大约300至大约600摄氏度。

著录项

  • 公开/公告号US8309472B2

    专利类型

  • 公开/公告日2012-11-13

    原文格式PDF

  • 申请/专利权人 DAVID GAO;FUMITAKE MIENO;

    申请/专利号US20100869620

  • 发明设计人 DAVID GAO;FUMITAKE MIENO;

    申请日2010-08-26

  • 分类号H01L21/311;H01L21/316;

  • 国家 US

  • 入库时间 2022-08-21 16:45:02

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