首页> 外国专利> MEMORY CELL WITH RESISTANCE-SWITCHING LAYERS INCLUDING BREAKDOWN LAYER

MEMORY CELL WITH RESISTANCE-SWITCHING LAYERS INCLUDING BREAKDOWN LAYER

机译:具有电阻切换层(包括故障层)的存储单元

摘要

A memory device in a 3-D read and write memory includes memory cells. Each memory cell includes a resistance-switching memory element (RSME) in series with a steering element. The RSME has first and second resistance-switching layers on either side of a conductive intermediate layer, and first and second electrodes at either end of the RSME. The first and second resistance-switching layers can both have a bipolar or unipolar switching characteristic. In a set or reset operation of the memory cell, an electric field is applied across the first and second electrodes. An ionic current flows in the resistance-switching layers, contributing to a switching mechanism. An electron flow, which does not contribute to the switching mechanism, is reduced due to scattering by the conductive intermediate layer, to avoid damage to the steering element. Particular materials and combinations of materials for the different layers of the RSME are provided.
机译:3-D读写存储器中的存储设备包括存储单元。每个存储单元包括与操纵元件串联的电阻切换存储元件(RSME)。 RSME在导电中间层的任一侧均具有第一和第二电阻转换层,并且在RSME的任一端均具有第一和第二电极。第一和第二电阻开关层都可以具有双极或单极开关特性。在存储单元的置位或复位操作中,在第一电极和第二电极之间施加电场。离子电流在电阻切换层中流动,有助于切换机制。由于导电中间层的散射,减少了对开关机构无用的电子流,以避免损坏操纵元件。提供了RSME不同层的特殊材料和材料组合。

著录项

  • 公开/公告号KR20130036292A

    专利类型

  • 公开/公告日2013-04-11

    原文格式PDF

  • 申请/专利权人 SANDISK 3D LLC;

    申请/专利号KR20137001492

  • 发明设计人 KREUPL FRANZ;FU CHU CHEN;NIAN YIBO;

    申请日2011-06-10

  • 分类号H01L45/00;H01L27/24;

  • 国家 KR

  • 入库时间 2022-08-21 16:27:23

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号