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Enhancement mode GaN HEMT device with gate spacer and method for fabricating the same

机译:具有栅极间隔物的增强模式GaN HEMT器件及其制造方法

摘要

Enhancement-mode GaN devices having a gate spacer, a gate metal material and a gate compound that are self-aligned, and a methods of forming the same. The materials are patterned and etched using a single photo mask, which reduces manufacturing costs. An interface of the gate spacer and the gate compound has lower leakage than the interface of a dielectric film and the gate compound, thereby reducing gate leakage. In addition, an ohmic contact metal layer is used as a field plate to relieve the electric field at a doped III-V gate compound corner towards the drain contact, which leads to lower gate leakage current and improved gate reliability.
机译:具有自对准的栅极间隔物,栅极金属材料和栅极化合物的增强型GaN器件及其形成方法。使用单个光掩模对材料进行图案化和蚀刻,从而降低了制造成本。栅极隔离物和栅极化合物的界面的泄漏低于介电膜和栅极化合物的界面,从而减少了栅极泄漏。另外,欧姆接触金属层用作场板,以减轻掺杂的III-V栅极化合物拐角处朝向漏极触点的电场,从而降低栅极泄漏电流并提高栅极可靠性。

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