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Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same
Time dependent dielectric breakdown (TDDB) test structure of semiconductor device and method of performing TDDB test using the same
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机译:半导体器件的时变介电击穿(TDDB)测试结构以及使用该结构的TDDB测试方法
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摘要
A time dependent dielectric breakdown (TDDB) test structure of a semiconductor device includes: a first test cell having a first test pattern in which a dielectric layer is formed between two electrodes; a second test cell spaced apart from the first test cell and having a second test pattern in which a dielectric layer is formed between two electrodes; and a barrier region configured to prevent electrical interference from occurring between the first test cell and the second test cell during a TDDB test.
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