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Methods of making laterally double diffused metal oxide semiconductor transistors having a reduced surface field structure

机译:制备具有减小的表面场结构的横向双扩散金属氧化物半导体晶体管的方法

摘要

An LDMOS transistor includes a substrate of semiconductor material, an insulator layer overlying the substrate, a semiconductor layer overlying the insulator layer, a RESURF region, and a gate. The semiconductor layer includes a first conductivity type well region, a second conductivity type source region in contact with the first conductivity type well region, a second conductivity type drain region. The RESURF region includes at least one first conductivity type material portion, and at least one portion of the at least one first conductivity type material portion electrically coupled to the first conductivity type well region. A semiconductor material having a second conductivity type is located below the RESURF region. The second conductivity type semiconductor material is also located over a part of the RESURF region. The gate is located over the first conductivity type well region and over the RESURF region.
机译:LDMOS晶体管包括半导体材料的衬底,覆盖在衬底上的绝缘体层,覆盖在绝缘体层上的半导体层,RESURF区域和栅极。半导体层包括第一导电类型阱区,与第一导电类型阱区接触的第二导电类型源极区,第二导电类型漏极区。 RESURF区域包括至少一个第一导电类型材料部分,以及至少一个第一导电类型材料部分的至少一部分电耦合到第一导电类型阱区域。具有第二导电类型的半导体材料位于RESURF区域下方。第二导电类型半导体材料也位于RESURF区域的一部分上方。栅极位于第一导电类型阱区域上方和RESURF区域上方。

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