首页> 外国专利> TEMPERATURE CONTROLLER FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT, METHOD FOR CALCULATING PID CONSTANTS IN SEMICONDUCTOR MANUFACTURING, AND METHOD FOR OPERATING TEMPERATURE CONTROLLER FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

TEMPERATURE CONTROLLER FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT, METHOD FOR CALCULATING PID CONSTANTS IN SEMICONDUCTOR MANUFACTURING, AND METHOD FOR OPERATING TEMPERATURE CONTROLLER FOR SEMICONDUCTOR MANUFACTURING EQUIPMENT

机译:用于半导体制造设备的温度控制器,用于计算半导体制造中的PID常数的方法以及用于用于半导体制造设备的温度控制器的操作方法

摘要

A temperature controller for semiconductor manufacturing equipment (3) is equipped with a temperature control means (72) for heating and cooling a fluid, which is used by semiconductor manufacturing equipment, on the inside in order to control the temperature of the fluid, and is equipped with a heat exchanger (7) that exchanges heat between fluid that has flowed in and the temperature control means (72). The temperature controller for semiconductor manufacturing equipment (3) is further equipped with: a proportional-integral-derivative (PID) constant calculation means (85) for calculating PID constants for PID control on the basis of the physical properties of the fluid, and a time constant of a temperature sensor (6) that measures the temperature of the fluid; and a PID control calculation means (86) that performs PID control of the temperature control means on the basis of the PID constants calculated by the PID constant calculation means (85).
机译:半导体制造设备(3)的温度控制器在内部装备有用于加热和冷却由半导体制造设备使用的流体的温度控制装置(72),以控制流体的温度。设有热交换器(7),该热交换器在流入的流体与温度控制装置(72)之间进行热交换。半导体制造设备的温度控制器(3)还配备有:比例积分微分(PID)常数计算装置(85),用于根据流体的物理特性计算PID常数以进行PID控制;以及测量流体温度的温度传感器(6)的时间常数; PID控制运算单元(86)根据由PID常数运算单元(85)运算出的PID常数,进行温度控制单元的PID控制。

著录项

  • 公开/公告号WO2014017378A1

    专利类型

  • 公开/公告日2014-01-30

    原文格式PDF

  • 申请/专利权人 KELK LTD.;

    申请/专利号WO2013JP69512

  • 发明设计人 MIMURA KAZUHIRO;

    申请日2013-07-18

  • 分类号G05B11/36;G05B13/02;G05D23/19;H01L21/304;

  • 国家 WO

  • 入库时间 2022-08-21 15:52:02

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