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Temperature controller for semiconductor manufacturing equipment, method for calculating PID constants in semiconductor manufacturing, and method for operating temperature controller for semiconductor manufacturing equipment

机译:用于半导体制造设备的温度控制器,用于计算半导体制造中的PID常数的方法以及用于操作半导体制造设备的温度控制器的方法

摘要

A temperature adjustment system configured to adjust the temperature of a fluid used in a semiconductor manufacturing apparatus includes: a heat exchanger including therein a temperature adjuster for heating and cooling the fluid, the heat exchanger being configured to perform heat exchange between the fluid therein and the temperature adjuster; a temperature sensor configured to measure the temperature of the fluid; a PID-constant calculator configured to calculate PID constants for PID control based on the physical properties of the fluid and a time constant of the temperature sensor; and a PID-control calculator configured to perform the PID control on the temperature adjuster with the PID constants calculated by the PID-constant calculator.
机译:一种温度调节系统,其被配置为调节在半导体制造设备中使用的流体的温度,包括:热交换器,其中包括用于加热和冷却所述流体的温度调节器,所述热交换器被配置为在其中的流体与所述流体之间进行热交换。温度调节器;温度传感器,其被配置为测量流体的温度; PID常数计算器,被配置为基于流体的物理特性和温度传感器的时间常数来计算用于PID控制的PID常数; PID控制计算器,被配置为利用由PID常数计算器计算出的PID常数对温度调节器进行PID控制。

著录项

  • 公开/公告号US9484231B2

    专利类型

  • 公开/公告日2016-11-01

    原文格式PDF

  • 申请/专利权人 KELK LTD.;

    申请/专利号US201314414771

  • 发明设计人 KAZUHIRO MIMURA;

    申请日2013-07-18

  • 分类号H01L21/67;G05D23/19;

  • 国家 US

  • 入库时间 2022-08-21 14:31:49

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