首页> 外国专利> A TRANSISTOR HAVING LOCALLY PROVIDED METAL SILICIDE REGION IN CONTACT AREAS AND A METHOD OF FORMING THE TRANSISTOR

A TRANSISTOR HAVING LOCALLY PROVIDED METAL SILICIDE REGION IN CONTACT AREAS AND A METHOD OF FORMING THE TRANSISTOR

机译:在接触区域中具有局部提供的金属硅化物区域的晶体管及其形成方法

摘要

By performing the retardation process between silicate based on the patterned dielectric layer such as an interlayer dielectric material , each metal silicide portions are provided to each of the contact region in a very localized manner , the amount is significantly reduced while the total of the metal silicide . In this way , the negative effects of stress in the metal silicide on the channel region of the field effect transistor is significantly reduced , yet maintains a low contact resistance .
机译:通过在基于图案化的介电层(例如层间介电材料)的硅酸盐之间执行延迟工艺,可以将每个金属硅化物部分以非常局部的方式提供给每个接触区域,从而大大减少了金属硅化物的总量, 。这样,金属硅化物中的应力对场效应晶体管的沟道区的负面影响得以显着降低,但仍保持较低的接触电阻。

著录项

  • 公开/公告号KR101366201B1

    专利类型

  • 公开/公告日2014-02-21

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20097006424

  • 申请日2007-08-29

  • 分类号H01L21/28;H01L21/336;

  • 国家 KR

  • 入库时间 2022-08-21 15:41:27

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