首页> 外国专利> Chemico-mechanical polishing pad with broad-spectrum end-point detection window and method of polishing with it

Chemico-mechanical polishing pad with broad-spectrum end-point detection window and method of polishing with it

机译:具有广谱终点检测窗的化学机械抛光垫及其抛光方法

摘要

There is provided a chemical mechanical polishing pad comprising: a polishing layer having a polishing surface and a broad spectrum endpoint acquisition window block having a thickness along an axis perpendicular to a plane of the polishing surface, the wide spectrum endpoint acquisition window block comprising a cyclic olefin addition polymer, wherein the The broad spectrum endpoint acquisition window block has a uniform chemical composition across its thickness, the wide spectrum endpoint acquisition window block having a spectrum loss of ≤ 40%, and the polishing surface being adapted to polish a substrate selected from a magnetic substrate, an optical substrate and a semiconductor substrate ,
机译:提供了一种化学机械抛光垫,其包括:具有抛光表面的抛光层和具有沿垂直于抛光表面的平面的轴线的厚度的广谱终点采集窗块,所述广谱终点采集窗块包括环状的。烯烃加成聚合物,其中所述广谱终点采集窗框在其整个厚度上具有均匀的化学组成,所述广谱终点采集窗框的光谱损耗≤40%,并且所述抛光表面适于抛光选自以下的基材磁性基板,光学基板和半导体基板,

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号