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RF power HEMT grown on a silicon or SiC substrate with a front-side plug connection

机译:通过前端插头连接在硅或SiC衬底上生长的射频功率HEMT

摘要

A compound semiconductor device includes a plurality of high-resistance crystalline silicon epitaxial layers and a plurality of activated dopant regions disposed in a same region of at least some of the epitaxial layers so that the activated dopant regions are aligned in a vertical direction perpendicular to a main surface of the epitaxial layers. The compound semiconductor device further includes an III-nitride compound semiconductor device structure disposed on the main surface of the epitaxial layers. The III-nitride compound semiconductor device structure has a source, a drain and a gate. An electrically conductive structure is formed from the activated dopant regions. The electrically conductive structure extends in the vertical direction through the epitaxial layers with the activated dopant regions toward the III-nitride compound semiconductor device structure, and is electrically connected to the source.
机译:一种化合物半导体器件,包括多个高电阻晶体硅外延层和多个活化掺杂剂区域,所述多个活化掺杂剂区域设置在至少一些所述外延层的相同区域中,使得所述活化掺杂剂区域在垂直于硅的垂直方向上排列。外延层的主表面。化合物半导体器件还包括设置在外延层的主表面上的III族氮化物化合物半导体器件结构。 III族氮化物化合物半导体器件结构具有源极,漏极和栅极。由激活的掺杂剂区域形成导电结构。导电结构在垂直方向上穿过具有被激活的掺杂剂区域的外延层朝着III族氮化物化合物半导体器件结构延伸,并且电连接到源极。

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