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How to stabilize the post-etch interface and minimize cue time issues before the next processing step

机译:在下一个处理步骤之前,如何稳定蚀刻后界面并使提示时间问题最小化

摘要

An etching method using a low temperature etching process of a dielectric barrier layer disposed on a substrate and a subsequent interface protection layer deposition process is provided. In one embodiment, a method for etching a dielectric barrier layer disposed on a substrate includes transferring the substrate on which the dielectric barrier layer is disposed into an etching process chamber and performing a process on the dielectric barrier layer. Remotely etching a plasma into an etchant gas supplied into an etching process chamber to etch a processed dielectric barrier layer disposed on the substrate; removing the dielectric barrier layer from the substrate Plasma sintering the dielectric barrier layer to form an interface protective layer after the dielectric barrier is removed from the substrate. [Selection] Figure 4E
机译:提供一种使用设置在基板上的电介质阻挡层的低温蚀刻工艺和随后的界面保护层沉积工艺的蚀刻方法。在一个实施例中,一种用于蚀刻设置在基板上的电介质阻挡层的方法包括:将其上设置有电介质阻挡层的基板转移到蚀刻处理室中,并对电介质阻挡层进行处理。远程地将等离子体蚀刻到蚀刻气体中,该蚀刻气体被供应到蚀刻处理室中,以蚀刻设置在基板上的处理后的电介质阻挡层;从基板上去除电介质阻挡层在从基板上去除电介质阻挡层之后,等离子体烧结电介质阻挡层以形成界面保护层。 [选择]图4E

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