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Reducing source contact to gate spacing to decrease transistor pitch

机译:减少源极与栅极间距的接触以减小晶体管间距

摘要

Methods and structures for transistors having reduced source contact to gate spacings in semiconductor devices are disclosed. In one embodiment, a method of forming a transistor can include: forming a gate over an active area of the transistor; forming source and drain regions aligned to the gate in the active area; forming source and drain contacts over the source and drain regions, where a spacing from the gate to the source contact of the transistor is less than a spacing from the gate to the drain contact of the transistor; and using one or more modified masks for forming doping profiles for the source region and the drain region.
机译:公开了用于晶体管的方法和结构,该晶体管在半导体器件中具有减小的源极与栅极间隔的接触。在一个实施例中,一种形成晶体管的方法可以包括:在晶体管的有源区域上方形成栅极;以及在晶体管的有源区域上方形成栅极。在有源区中形成与栅对准的源区和漏区;在源极和漏极区域上方形成源极和漏极触点,其中从晶体管的栅极到源极触点的间隔小于从晶体管的栅极到漏极触点的间隔;使用一个或多个修改的掩模来形成用于源极区和漏极区的掺杂轮廓。

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