首页> 外国专利> WAFER END SURFACE POLISHING PAD, WAFER END SURFACE POLISHING APPARATUS, AND WAFER END SURFACE POLISHING METHOD

WAFER END SURFACE POLISHING PAD, WAFER END SURFACE POLISHING APPARATUS, AND WAFER END SURFACE POLISHING METHOD

机译:晶片端面抛光垫,晶片端面抛光装置和晶片端面抛光方法

摘要

PROBLEM TO BE SOLVED: To provide a wafer end surface polishing pad capable of suppressing scattering of slurry and reducing LPD on the rear surface of a wafer after polishing of an end surface.SOLUTION: The wafer end surface polishing pad is a pad for polishing an end surface of a wafer. A main surface composed of a front surface and a back surface has a substantially rectangular shape. A plurality of grooves opened at both ends in a lateral direction of the pad are arranged along a short direction of the pad with a space in a longitudinal direction of the pad.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种晶片端面抛光垫,该晶片抛光端面能够在抛光端面后抑制浆料的散布并减少晶片背面上的LPD。解决方案:晶片端面抛光垫是一种用于抛光晶片表面的抛光垫。晶片的端面。由正面和背面组成的主表面具有大致矩形的形状。沿衬垫的短边方向在其两端上开口的多个凹槽沿衬垫的短边方向排列,在衬垫的纵向上有一定的间隔。

著录项

  • 公开/公告号JP2017191886A

    专利类型

  • 公开/公告日2017-10-19

    原文格式PDF

  • 申请/专利权人 SUMCO CORP;

    申请/专利号JP20160081329

  • 发明设计人 TANIMOTO RYUICHI;ANDO SHIN;YAMADA YASUO;

    申请日2016-04-14

  • 分类号H01L21/304;B24B9;B24B37/26;

  • 国家 JP

  • 入库时间 2022-08-21 14:01:19

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