X-ray diffraction based crystallographic analysis method

摘要

A method of X-ray diffraction based analysis for determining the structure of a crystalline sample is provided. The method includes performing a pre-experiment to collect a first set of diffraction images including corresponding intensity reflections. The method also includes performing a main experiment to collect a second set of diffracted images, the diffracted image of the second set being less than the relative intensity created during the first experiment. Including the reflection having a high relative intensity, at least some of the diffracted images of the second set include overreflection resulting from detector saturation. The method also includes replacing the intensity of the excess reflection from the second set of images with the intensity obtained for the corresponding reflection from the first set of images.