SUBSTRUCTURE CHARACTERISTICS OF FINE-GRAINED AND ALLOYS DISCLOSED BY X-RAY MICROSCOPY AND DIFFRACTION ANALYSIS Description and Application of Diffraction Method Description of X-Ray Double-Crystal Diffractometer Combining X-ray Microscopy and Diffraction

摘要

The topographical relationship of the grains of a fine-grained material and the fine-structural details of their surface texture are disclosed by a special technique of reflection x-ray microscopy.nQuantitative information is obtained concerning the lattice misalignment of the grains, the size of subgrains, disorientation angle between subgrains, lattice misalignment existing within the subgrains and the mature of low-angle boundaries.