首页> 外国专利> Apparatus and method for automatic detection of diaphragm coating or surface contamination for capacitance diaphragm gauges

Apparatus and method for automatic detection of diaphragm coating or surface contamination for capacitance diaphragm gauges

机译:自动检测电容式膜片计的膜片涂层或表面污染的设备和方法

摘要

A system and a method detect contamination of a diaphragm in a capacitance diaphragm gauge wherein a contaminated diaphragm deflects less in the presence of pressure than an uncontaminated diaphragm. The system and method measure a base pressure. A DC voltage is applied between the diaphragm and a fixed electrode to cause the diaphragm to deflect to simulate an effective pressure. The system and method measure a combined pressure caused by the base pressure and the effective pressure. The system and method subtract the base pressure to determine the effective pressure caused by the static diaphragm deflection. If the measured effective pressure is less than an acceptable effective pressure, the system and method determine that the diaphragm is contaminated.
机译:一种用于检测电容膜片计中膜片污染的系统和方法,其中,在压力存在下,被污染的膜片的偏斜小于未污染的膜片。该系统和方法测量基本压力。在膜片和固定电极之间施加直流电压,以使膜片偏转以模拟有效压力。该系统和方法测量由基本压力和有效压力引起的组合压力。该系统和方法减去基本压力以确定由静态膜片挠曲引起的有效压力。如果测得的有效压力小于可接受的有效压力,则该系统和方法确定隔膜被污染。

著录项

  • 公开/公告号US9677964B2

    专利类型

  • 公开/公告日2017-06-13

    原文格式PDF

  • 申请/专利权人 FERRAN TECHNOLOGY INC.;

    申请/专利号US201514634805

  • 发明设计人 DAVID J. FERRAN;ROBERT J. FERRAN;

    申请日2015-02-28

  • 分类号G01L27/00;G01L9/00;G01L21/00;

  • 国家 US

  • 入库时间 2022-08-21 13:46:05

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