METHOD FOR CHARACTERIZING A SAMPLE COMBINING AN X-RAY CHARACTERIZATION TECHNIQUE AND A SECONDARY IONIZATION MASS SPECTROMETRY CHARACTERIZATION TECHNIQUE

摘要

A method of characterizing a sample (300) combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique, characterized in that it comprises: a step of providing a tip ( 100), the tip including a first end surface (110), a second end surface (120), a first cylindrical region (101) carrying the first end surface (110) and a second region (102). in contact with the first cylindrical region (101) and tapering toward the second end surface (120); a machining step (20) of the second region (102) to obtain a sample holder (200) comprising a planar surface (220), the planar surface forming an end surface of the sample holder (200) the area of said planar surface (220) being smaller than the area of the first end surface (110); a step of placing (30) the sample (300) on the planar surface (220) of the sample holder (200); a first step of characterizing the sample (300) using an X-ray characterization technique; a second step of characterizing the sample (300) using a characterization technique by secondary ionization mass spectrometry.